This part of IEC 62899 specifies the optical measurement method for acquiring two-dimensional images of voids and obtaining the void-related attributes in the dried or cured printed patterns which are part of the electronic products in the field of printed electronics. The measurable voids using this document are limited to those that are distinguishable by the optical image measurement.
NOTE In this document, void means an imperfection of pattern observed from a two-dimensional (2D) top-view.
