The requirements of modern electronic equipment have indicated a demand for a method for testing screening attenuation of microwave components over their whole frequency range. Convenient test methods exist for low frequencies and components of regular shape. These test methods are described in the relevant IEC product specifications (e.g. IEC 621 53-4-3).
For higher frequencies and for components of irregular shape, a new test method has become necessary and such a test method is described in this International Standard. This International Standard describes the measurement of screening attenuation by the reverberation chamber test method, sometimes named mode stirred chamber, suitable for virtually any type of microwave component and having no theoretical upper frequency limit.
It is only limited toward low frequencies due to the size of the test equipment, which is frequency- dependent and is only one of several methods of measuring screening attenuation. For the purpose of this standard, examples of microwave components are waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners etc.
